Course 2 begins with the definitions of resistivity and sheet resistance of semiconductors and metals and emphasizes the importance of working with the correct units for each. We see how to calculate the sheet resistance of a thin conducting film once we know its resistivity. A method to determine the contact resistance using the transfer length method is described, along with the definition of the specific contact resistivity.
Current-voltage (IV) measurements of p-n junction diodes are used to extract key device parameters such as the ideality factor and series resistance. The course project explores how process monitor blocks are used to maintain manufacturing integrity.
